標題: Estimating the Detection Stability of a Si Nanowire Sensor Using an Additional Charging Electrode
作者: Chen, Min-Cheng
Chen, Hsiao-Chien
Lee, Ta-Hsien
Lin, Yu-Hsien
Shih, Jyun-Hung
Wang, Bo-Wei
Hou, Yun-Fang
Chen, Yi-Ju
Lin, Chia-Yi
Lin, Chang-Hsien
Hsieh, Yi-Ping
Ho, ChiaHua
Hua, Mu-Yi
Qiu, Jian-Tai
Wang, Tahui
Yang, Fu-Liang
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
關鍵字: Charge coupling effect;dection stability;nanosensor fabrication;nanowire FET;semiconductive sensors
公開日期: 2013
摘要: This paper proposes a sensing stability estimation method that involves using an additional forcing electrode to simulate the surface charge coupling effect for bottom gate nanowire sensors. The alteration of the Si nanowire can be observed by using the charging electrode without any complex surface treatment and micro-channel setup. The nanowire sensor has a distinct charge-sensitive slope (V-th shift > 60 mV/10(-16)C) with a wire-width scaling of 35 nm. The proposed estimation technique simplifies the charge sensing operation.
URI: http://hdl.handle.net/11536/135408
ISBN: 978-1-4799-0113-5
978-1-4799-0112-8
ISSN: 1541-7026
期刊: 2013 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)
顯示於類別:會議論文