標題: | Estimating the Detection Stability of a Si Nanowire Sensor Using an Additional Charging Electrode |
作者: | Chen, Min-Cheng Chen, Hsiao-Chien Lee, Ta-Hsien Lin, Yu-Hsien Shih, Jyun-Hung Wang, Bo-Wei Hou, Yun-Fang Chen, Yi-Ju Lin, Chia-Yi Lin, Chang-Hsien Hsieh, Yi-Ping Ho, ChiaHua Hua, Mu-Yi Qiu, Jian-Tai Wang, Tahui Yang, Fu-Liang 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
關鍵字: | Charge coupling effect;dection stability;nanosensor fabrication;nanowire FET;semiconductive sensors |
公開日期: | 2013 |
摘要: | This paper proposes a sensing stability estimation method that involves using an additional forcing electrode to simulate the surface charge coupling effect for bottom gate nanowire sensors. The alteration of the Si nanowire can be observed by using the charging electrode without any complex surface treatment and micro-channel setup. The nanowire sensor has a distinct charge-sensitive slope (V-th shift > 60 mV/10(-16)C) with a wire-width scaling of 35 nm. The proposed estimation technique simplifies the charge sensing operation. |
URI: | http://hdl.handle.net/11536/135408 |
ISBN: | 978-1-4799-0113-5 978-1-4799-0112-8 |
ISSN: | 1541-7026 |
期刊: | 2013 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS) |
顯示於類別: | 會議論文 |