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dc.contributor.authorLee, WIen_US
dc.date.accessioned2014-12-08T15:02:46Z-
dc.date.available2014-12-08T15:02:46Z-
dc.date.issued1996-03-04en_US
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.116082en_US
dc.identifier.urihttp://hdl.handle.net/11536/1402-
dc.description.abstractA long term and comprehensive study has been performed to identify the origin of the Ge center in AlGaAs grown by organometallic vapor phase epitaxy. With a series of deductive investigations, AsH3 gas has been undoubtedly identified as the source of the Ge contamination. Depending on the AsH3 quality, one to two orders of magnitude of difference in Ge trap densities has been observed. Long-term observations indicate fairly constant Ge content throughout most of the AsH3 tank lifetime. Different impurity getters were attempted to remove the Ge contaminant. While most getters can eliminate the oxygen-related defects in AlGaAs, no getters were able to remove the Ge DX center. (C) 1996 American Institute of Physics.en_US
dc.language.isoen_USen_US
dc.titleSource of Ge centers in AlGaAs grown by organometallic vapor phase epitaxy and the effect of impurity gettersen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.116082en_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.citation.volume68en_US
dc.citation.issue10en_US
dc.citation.spage1368en_US
dc.citation.epage1370en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.department友訊交大聯合研發中心zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.contributor.departmentD Link NCTU Joint Res Ctren_US
dc.identifier.wosnumberWOS:A1996TX86100020-
dc.citation.woscount0-
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