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dc.contributor.authorLee, Yu-Minen_US
dc.contributor.authorPan, Kuan-Teen_US
dc.contributor.authorChen, Chunen_US
dc.date.accessioned2018-08-21T05:54:00Z-
dc.date.available2018-08-21T05:54:00Z-
dc.date.issued2017-05-01en_US
dc.identifier.issn1063-8210en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TVLSI.2016.2645230en_US
dc.identifier.urihttp://hdl.handle.net/11536/145455-
dc.description.abstractThrough-silicon-via (TSV)-to-TSV coupling issue can degrade the signal integrity in 3-D integrated circuit designs. This paper develops a 3-D partitioning-based force-directed placer, NaPer, to reduce the total coupling noise between TSVs and alleviate the maximum coupling noise between them. We introduce two denoise forces: TSV decoupling force and TSV density force. The TSV decoupling force is determined by the coupling noise between TSVs for separating strong coupling TSVs, and the TSV density force is determined by the TSV density for evenly distributing TSVs. The experimental results show that NaPer can effectively reduce 15.0% total TSV coupling noise and 42.7% maximum TSV coupling noise on average with only 4.5% wirelength overhead. Besides, NaPer also shows great performance in wirelength that is competitive to the state-of-the-art 3-D placer.en_US
dc.language.isoen_USen_US
dc.subjectCoupling awareen_US
dc.subjectlayouten_US
dc.subjectphysical designen_US
dc.subjectplacementen_US
dc.subjectthree-dimensional integrated circuitsen_US
dc.subjectthrough-silicon via (TSV) couplingen_US
dc.titleNaPer: A TSV Noise-Aware Placeren_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TVLSI.2016.2645230en_US
dc.identifier.journalIEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMSen_US
dc.citation.volume25en_US
dc.citation.spage1703en_US
dc.citation.epage1713en_US
dc.contributor.department電機工程學系zh_TW
dc.contributor.departmentDepartment of Electrical and Computer Engineeringen_US
dc.identifier.wosnumberWOS:000400475200011en_US
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