完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Wu, Kai-Chiang | en_US |
dc.contributor.author | Tseng, Tien-Hung | en_US |
dc.contributor.author | Li, Shou-Chun | en_US |
dc.date.accessioned | 2018-08-21T05:56:27Z | - |
dc.date.available | 2018-08-21T05:56:27Z | - |
dc.date.issued | 2018-01-01 | en_US |
dc.identifier.issn | 1530-1591 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/146203 | - |
dc.description.abstract | Device aging, which causes significant loss on circuit performance and lifetime, has been a primary factor in reliability degradation of nanoscale designs. In this paper, we propose to take advantage of aging-induced clock skews (i.e., make them useful for aging tolerance) by manipulating these lime-varying skews to compensate for the performance degradation of logic networks. The goal is to assign achievable/reasonable aging-induced clock skews in a circuit, such that its overall performance degradation due to aging can be minimized, that is, the lifespan can be maximized. On average, 25% aging tolerance can be achieved with insignificant design overhead. | en_US |
dc.language.iso | en_US | en_US |
dc.title | MAUI: Making Aging Useful, Intentionally | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | PROCEEDINGS OF THE 2018 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE) | en_US |
dc.citation.spage | 527 | en_US |
dc.citation.epage | 532 | en_US |
dc.contributor.department | 資訊工程學系 | zh_TW |
dc.contributor.department | Department of Computer Science | en_US |
dc.identifier.wosnumber | WOS:000435148800095 | en_US |
顯示於類別: | 會議論文 |