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dc.contributor.authorWu, Kai-Chiangen_US
dc.contributor.authorTseng, Tien-Hungen_US
dc.contributor.authorLi, Shou-Chunen_US
dc.date.accessioned2018-08-21T05:56:27Z-
dc.date.available2018-08-21T05:56:27Z-
dc.date.issued2018-01-01en_US
dc.identifier.issn1530-1591en_US
dc.identifier.urihttp://hdl.handle.net/11536/146203-
dc.description.abstractDevice aging, which causes significant loss on circuit performance and lifetime, has been a primary factor in reliability degradation of nanoscale designs. In this paper, we propose to take advantage of aging-induced clock skews (i.e., make them useful for aging tolerance) by manipulating these lime-varying skews to compensate for the performance degradation of logic networks. The goal is to assign achievable/reasonable aging-induced clock skews in a circuit, such that its overall performance degradation due to aging can be minimized, that is, the lifespan can be maximized. On average, 25% aging tolerance can be achieved with insignificant design overhead.en_US
dc.language.isoen_USen_US
dc.titleMAUI: Making Aging Useful, Intentionallyen_US
dc.typeProceedings Paperen_US
dc.identifier.journalPROCEEDINGS OF THE 2018 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE)en_US
dc.citation.spage527en_US
dc.citation.epage532en_US
dc.contributor.department資訊工程學系zh_TW
dc.contributor.departmentDepartment of Computer Scienceen_US
dc.identifier.wosnumberWOS:000435148800095en_US
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