完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Cheng, C. H. | en_US |
dc.contributor.author | Chin, Albert | en_US |
dc.contributor.author | Yeh, F. S. | en_US |
dc.date.accessioned | 2019-04-02T05:59:55Z | - |
dc.date.available | 2019-04-02T05:59:55Z | - |
dc.date.issued | 2011-01-31 | en_US |
dc.identifier.issn | 0003-6951 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1063/1.3549689 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/150240 | - |
dc.description.abstract | We report a high performance and low-power operated resistive memory. Using stacked covalent-bond-dielectric GeOx on metal-oxide SrTiOx to form the cost-effective Ni/GeOx/SrTiOx/TaN resistive random access memory, ultralow set power of small 1 mu W (0.9 mu A at 1.2 V), reset power of 13 pW (0.13 nA at 0.1 V), fast 50 ns switching time and good 10(6) cycling endurance are realized. (C) 2011 American Institute of Physics. [doi:10.1063/1.3549689] | en_US |
dc.language.iso | en_US | en_US |
dc.title | Stacked GeO/SrTiOx Resistive Memory with Ultralow Resistance Currents | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1063/1.3549689 | en_US |
dc.identifier.journal | APPLIED PHYSICS LETTERS | en_US |
dc.citation.volume | 98 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000286988400052 | en_US |
dc.citation.woscount | 27 | en_US |
顯示於類別: | 期刊論文 |