標題: High-Density Multiple Bits-per-Cell 1T4R RRAM Array with Gradual SET/RESET and its Effectiveness for Deep Learning
作者: Hsieh, E. R.
Giordano, M.
Hodson, B.
Levy, A.
Osekowsky, S. K.
Radway, R. M.
Shih, Y. C.
Wan, W.
Wu, T. F.
Zheng, X.
Nelson, M.
Le, B. Q.
Wong, H. -S. P.
Mitra, S.
Wong, S.
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 1-Jan-2019
摘要: We present the first demonstration of 1T4R Resistive RAM (RRAM) array storing two bits per RRAM cell. Our HfO2-based RRAM is built using a logic foundry technology that is fully compatible with the CMOS back-end process. We present a new approach to program RRAM cells using gradual SET/RESET pulses while minimizing disturbances on adjacent cells (belonging to the same 1T4R RRAM structure) this new approach makes pour multiple-bits-per-cell 1T4R RRAM array demonstration possible. We report over 106 cycles of endurance and a projected 10-year retention at 120 degrees C. Using measured data from our 2 bits-per-cell 1T4R RRAM array, we analyze multiple deep learning applications and demonstrate high degrees of inference accuracy (within 0.01% of ideal values).
URI: http://hdl.handle.net/11536/155249
ISBN: 978-1-7281-4031-5
ISSN: 2380-9248
期刊: 2019 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM)
起始頁: 0
結束頁: 0
Appears in Collections:Conferences Paper