標題: | Electrical transport in transparent conducting tin-doped indium oxide films |
作者: | Yeh, S. S. Lu, J. Y. Shiu, M. W. Lin, J. J. 物理研究所 Institute of Physics |
關鍵字: | electrical transport;Bloch-Gruneisen law;disorder |
公開日期: | 2006 |
摘要: | We have studied the temperature behavior of the electrical resistivities rho(T) in a series of tin-doped indium-oxide films with different residual resistivities rho(0) varying from 218 to 568 mu Omega cm. We found that the temperature dependence of p can be well described by the Bloch-Gruneisen law from 300 K down to about 100 K. In particular, we observed that the strength of the electron-phonon coupling, beta(BG), (which characterizes a prefactor in the Bloch-Gruneisen formula) increases linearly with increasing rho(0). This result is not understood in terms of current theoretical concept for electron-phonon interaction in metals. |
URI: | http://hdl.handle.net/11536/17135 |
ISBN: | 0-7354-0347-3 |
ISSN: | 0094-243X |
期刊: | Low Temperature Physics, Pts A and B |
Volume: | 850 |
起始頁: | 1548 |
結束頁: | 1549 |
顯示於類別: | 會議論文 |