標題: An efficient test and diagnosis scheme for the feedback type of analog circuits with minimal added circuits
作者: Lin, JW
Lee, CL
Chen, JE
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 2002
URI: http://hdl.handle.net/11536/18846
ISBN: 0-7695-1472-3
期刊: DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, 2002 PROCEEDINGS
起始頁: 1119
結束頁: 1119
Appears in Collections:Conferences Paper