Testable design and testing of MCMs based on multifrequency scan

Full metadata record

DC Field	Value	Language
dc.contributor.author	Tseng, WD	en_US
dc.contributor.author	Wang, KC	en_US
dc.date.accessioned	2014-12-08T15:27:35Z	-
dc.date.available	2014-12-08T15:27:35Z	-
dc.date.issued	1996	en_US
dc.identifier.isbn	0-8186-7478-4	en_US
dc.identifier.uri	http://hdl.handle.net/11536/19838	-
dc.language.iso	en_US	en_US
dc.title	Testable design and testing of MCMs based on multifrequency scan	en_US
dc.type	Proceedings Paper	en_US
dc.identifier.journal	PROCEEDINGS OF THE FIFTH ASIAN TEST SYMPOSIUM (ATS '96)	en_US
dc.citation.spage	75	en_US
dc.citation.epage	80	en_US
dc.contributor.department	資訊工程學系	zh_TW
dc.contributor.department	Department of Computer Science	en_US
dc.identifier.wosnumber	WOS:A1996BG49W00013	-
Appears in Collections:	Conferences Paper