Full metadata record
DC FieldValueLanguage
dc.contributor.authorLu, CWen_US
dc.contributor.authorLee, CLen_US
dc.contributor.authorChen, JEen_US
dc.date.accessioned2014-12-08T15:27:37Z-
dc.date.available2014-12-08T15:27:37Z-
dc.date.issued1996en_US
dc.identifier.isbn0-8186-7655-8en_US
dc.identifier.urihttp://hdl.handle.net/11536/19867-
dc.language.isoen_USen_US
dc.titleA fast and sensitive built-in current sensor for IDDQ testingen_US
dc.typeProceedings Paperen_US
dc.identifier.journal1996 IEEE INTERNATIONAL WORKSHOP ON IDDQ TESTING, DIGEST OF PAPERSen_US
dc.citation.spage56en_US
dc.citation.epage58en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:A1996BG63C00011-
Appears in Collections:Conferences Paper