A fast and sensitive built-in current sensor for IDDQ testing

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	Lu, CW	en_US
dc.contributor.author	Lee, CL	en_US
dc.contributor.author	Chen, JE	en_US
dc.date.accessioned	2014-12-08T15:27:37Z	-
dc.date.available	2014-12-08T15:27:37Z	-
dc.date.issued	1996	en_US
dc.identifier.isbn	0-8186-7655-8	en_US
dc.identifier.uri	http://hdl.handle.net/11536/19867	-
dc.language.iso	en_US	en_US
dc.title	A fast and sensitive built-in current sensor for IDDQ testing	en_US
dc.type	Proceedings Paper	en_US
dc.identifier.journal	1996 IEEE INTERNATIONAL WORKSHOP ON IDDQ TESTING, DIGEST OF PAPERS	en_US
dc.citation.spage	56	en_US
dc.citation.epage	58	en_US
dc.contributor.department	電子工程學系及電子研究所	zh_TW
dc.contributor.department	Department of Electronics Engineering and Institute of Electronics	en_US
dc.identifier.wosnumber	WOS:A1996BG63C00011	-
顯示於類別：	會議論文