| 标题: | Foreword for the Special Issue on ESD Technology |
| 作者: | Boselli, Gianluca Ker, Ming-Dou Duvvury, Charvaka 电子工程学系及电子研究所 Department of Electronics Engineering and Institute of Electronics |
| 公开日期: | 1-十二月-2012 |
| URI: | http://dx.doi.org/10.1109/TDMR.2012.2225232 http://hdl.handle.net/11536/20862 |
| ISSN: | 1530-4388 |
| DOI: | 10.1109/TDMR.2012.2225232 |
| 期刊: | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY |
| Volume: | 12 |
| Issue: | 4 |
| 起始页: | 588 |
| 结束页: | 588 |
| 显示于类别： | Articles |
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- Special section on bioinformatics - Foreword / Hwang, JK;Kao, MY;Sun, CT;Hsu, WL
- 编辑室的话 / 张维安;黄淑铃
- Special Issue on Technologies and Applications of Artificial Intelligence Foreword / Hsu, Chun-Nan;Hsu, Tsan-sheng;King, Irwing;Lee, Yuh-Jye;Wu, I-Chen
- Area-Efficient ESD-Transient Detection Circuit With Smaller Capacitance for On-Chip Power-Rail ESD Protection in CMOS ICs / Chen, Shih-Hung;Ker, Ming-Dou
- ESD failure mechanisms of analog I/O cells in 0.18-mu m CMOS technology / Ker, MD;Chen, SH;Chuang, CH
- Special Issue: Challenges for Advanced Technology Foreword / Wen, Ue-Pyng;Sheu, D. Daniel;Hwang, Sheue-Ling;Perng, Der-Baau
- Novel implantation method to improve machine-model electrostatic discharge robustness of stacked N-channel metal-oxide semiconductors (NMOS) in sub-quarter-micron complementary metal-oxide semiconductors (CMOS) technology / Ker, MD;Hsu, HC;Peng, JJ
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