标题: | Eliminate Kirkendall voids in solder reactions on nanotwinned copper |
作者: | Liu, Tao-Chi Liu, Chien-Min Huang, Yi-Sa Chen, Chih Tu, King-Ning 材料科学与工程学系 Department of Materials Science and Engineering |
关键字: | Kirkendall voids;Twinning;Copper;Nanostructured materials;Diffusion |
公开日期: | 1-三月-2013 |
摘要: | Electroplating was used to fabricate a high density of nanotwins that exhibited the preferred (111) orientation in Cu. We found no formation of Kirkendall voids in solder reactions on the nanotwinned Cu. This was due to the high density of steps and kinks on the nanotwin boundaries, which serve as vacancy sinks. Thus the vacancy concentration cannot reach supersaturation and nucleate voids. The finding is a significant advance in the problem of solder joint reliability in microelectronic three-dimensional integrated circuit devices. (c) 2012 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved. |
URI: | http://dx.doi.org/10.1016/j.scriptamat.2012.10.024 http://hdl.handle.net/11536/21014 |
ISSN: | 1359-6462 |
DOI: | 10.1016/j.scriptamat.2012.10.024 |
期刊: | SCRIPTA MATERIALIA |
Volume: | 68 |
Issue: | 5 |
起始页: | 241 |
结束页: | 244 |
显示于类别: | Articles |
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