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dc.contributor.authorWatanabe, Hiroshien_US
dc.contributor.authorYao, Kira (Chih-Wei)en_US
dc.contributor.authorLin, Jerry (Po-Jui)en_US
dc.date.accessioned2014-12-08T15:35:19Z-
dc.date.available2014-12-08T15:35:19Z-
dc.date.issued2014-04-01en_US
dc.identifier.issn0018-9383en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TED.2014.2306935en_US
dc.identifier.urihttp://hdl.handle.net/11536/23952-
dc.description.abstractThe electrical property of very small floating island whose diameter is less than the de Broglie length is numerically investigated without fitting parameters. In general, it is difficult to well define the capacitance of very small floating islands. In this paper, instead of using the capacitance of islands, the kicking algorithm is applied for simulating the single-electron phenomena of spherical islands (the diameter: O = 0.6, 4, and 6 nm). As a result, the self-potentials of islands are successfully obtained within the precision equivalent to the movement of the sole electron with regard to given gate voltages. In addition, the transient simulation is demonstrated using the dwell time during which an electron is waiting for the next tunneling. The Coulomb blockade is successfully simulated without using the capacitance of very small floating islands. It is also found that trap-assisted tunneling is prohibited by Coulomb blockade at low electric field and can occur at high electric field.en_US
dc.language.isoen_USen_US
dc.subjectCapacitance coupling ratioen_US
dc.subjectCoulomb blockadeen_US
dc.subjectdevice modelingen_US
dc.subjectfloating gateen_US
dc.subjectfloating islanden_US
dc.subjectsilicon doten_US
dc.subjectsingle-electron phenomenaen_US
dc.subjecttrap-assisted tunnelingen_US
dc.titleNumerical Study of Very Small Floating Islandsen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TED.2014.2306935en_US
dc.identifier.journalIEEE TRANSACTIONS ON ELECTRON DEVICESen_US
dc.citation.volume61en_US
dc.citation.issue4en_US
dc.citation.spage1145en_US
dc.citation.epage1152en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department電機資訊學士班zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentUndergraduate Honors Program of Electrical Engineering and Computer Scienceen_US
dc.identifier.wosnumberWOS:000333464000031-
dc.citation.woscount1-
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