標題: | High temperature stability 850-nm In0.15Al0.08Ga0.77As/Al0.3Ga0.7As vertical-cavity surface-emitting laser with single Al0.75Ga0.25As current blocking layer |
作者: | Chang, YA Lai, FI Yu, HC Kuo, HC Laih, LW Yu, CL Wang, SC 光電工程學系 Department of Photonics |
關鍵字: | 850nm;VCSEL;leakage current;current blocking layer |
公開日期: | 2005 |
摘要: | In this paper, we employed a high bandgap Al0.75Ga0.25As layer acting as an electronic blocking layer in the upper In0.15Al0.08Ga0.77As/Al0.3Ga0.7As active region before the growth of p-type layers of 850-nm vertical-cavity surface-emitting lasers (VCSELs). A threshold current of 1.33mA and slope efficiency of 0.53W/A at 25 degrees C were obtained, and the temperature dependent light output and voltage versus current (L-I-V) characteristics showed that the VCSELs with a high bandgap Al0.75Ga0.25As layer were more stable when the substrate temperature was in a range of 25-95 degrees C. The threshold current increased with temperature up to 95 degrees C was less than 21% and the slope efficiency dropped only 24.5%. |
URI: | http://hdl.handle.net/11536/24746 http://dx.doi.org/10.1143/JJAP.44.L901 |
ISSN: | 0021-4922 |
DOI: | 10.1143/JJAP.44.L901 |
期刊: | JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS |
Volume: | 44 |
Issue: | 28-32 |
起始頁: | L901 |
結束頁: | L902 |
Appears in Collections: | Articles |
Files in This Item:
If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.