| 標題: | The potential of functional scaling |
| 作者: | Chin, A McAlister, SP 奈米科技中心 Center for Nanoscience and Technology |
| 公開日期: | 1-Jan-2005 |
| URI: | http://dx.doi.org/10.1109/MCD.2005.1388766 http://hdl.handle.net/11536/25366 |
| ISSN: | 8755-3996 |
| DOI: | 10.1109/MCD.2005.1388766 |
| 期刊: | IEEE CIRCUITS & DEVICES |
| Volume: | 21 |
| Issue: | 1 |
| 起始頁: | 27 |
| 結束頁: | 35 |
| Appears in Collections: | Articles |
Files in This Item:
If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.

