标题: The potential of functional scaling
作者: Chin, A
McAlister, SP
奈米科技中心
Center for Nanoscience and Technology
公开日期: 1-一月-2005
URI: http://dx.doi.org/10.1109/MCD.2005.1388766
http://hdl.handle.net/11536/25366
ISSN: 8755-3996
DOI: 10.1109/MCD.2005.1388766
期刊: IEEE CIRCUITS & DEVICES
Volume: 21
Issue: 1
起始页: 27
结束页: 35
显示于类别:Articles


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