標題: | High speed performance of 850 nm silicon-implanted AlGaAs/GaAs vertical cavity emitting lasers |
作者: | Kuo, HC Chang, YS Lai, FY Hseuh, TH Chu, LT Laih, LH Wang, SC 光電工程學系 Department of Photonics |
關鍵字: | VCSEL;Si implant;implantation-induced disorder;high speed |
公開日期: | 1-Mar-2004 |
摘要: | In this paper, we report a high speed performance of silicon-implanted vertical surface emitting lasers (VCSELs) with the aperture size 6x6 mum(2). These VCSELs exhibit kink-free current-light output with threshold currents similar to1.14 mA, and the slope efficiencies similar to0.5 W/A. The eye diagram of VCSEL operating at 10 Gb/s with 6 mA bias and 6 dB extinction ratio shows very clean eye. The rise time is 29 ps and fall time is 41 ps with jitter (p-p) = 21 ps. We have accumulated life test data up to 1000 h at 70 degreesC/10 mA. (C) 2003 Elsevier Ltd. All rights reserved. |
URI: | http://dx.doi.org/10.1016/j.sse.2003.07.004 http://hdl.handle.net/11536/26973 |
ISSN: | 0038-1101 |
DOI: | 10.1016/j.sse.2003.07.004 |
期刊: | SOLID-STATE ELECTRONICS |
Volume: | 48 |
Issue: | 3 |
起始頁: | 483 |
結束頁: | 485 |
Appears in Collections: | Articles |
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