標題: High speed performance of 850 nm silicon-implanted AlGaAs/GaAs vertical cavity emitting lasers
作者: Kuo, HC
Chang, YS
Lai, FY
Hseuh, TH
Chu, LT
Laih, LH
Wang, SC
光電工程學系
Department of Photonics
關鍵字: VCSEL;Si implant;implantation-induced disorder;high speed
公開日期: 1-三月-2004
摘要: In this paper, we report a high speed performance of silicon-implanted vertical surface emitting lasers (VCSELs) with the aperture size 6x6 mum(2). These VCSELs exhibit kink-free current-light output with threshold currents similar to1.14 mA, and the slope efficiencies similar to0.5 W/A. The eye diagram of VCSEL operating at 10 Gb/s with 6 mA bias and 6 dB extinction ratio shows very clean eye. The rise time is 29 ps and fall time is 41 ps with jitter (p-p) = 21 ps. We have accumulated life test data up to 1000 h at 70 degreesC/10 mA. (C) 2003 Elsevier Ltd. All rights reserved.
URI: http://dx.doi.org/10.1016/j.sse.2003.07.004
http://hdl.handle.net/11536/26973
ISSN: 0038-1101
DOI: 10.1016/j.sse.2003.07.004
期刊: SOLID-STATE ELECTRONICS
Volume: 48
Issue: 3
起始頁: 483
結束頁: 485
顯示於類別:期刊論文


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