標題: | DESIGN OF PSEUDOEXHAUSTIVE TESTABLE PLA WITH LOW OVERHEAD |
作者: | SHEN, WZ HWANG, GH HSU, WJ JAN, YJ 電控工程研究所 Institute of Electrical and Control Engineering |
關鍵字: | BUILT-IN SELF-TEST;DESIGN FOR TESTABILITY;PROGRAMMABLE LOGIC ARRAY;PSEUDOEXHAUSTIVE TESTING |
公開日期: | 1-Jul-1993 |
摘要: | The pseudoexhaustive testing (PET) scheme is a economic approach to test a large embedded programmable logic array (PIA). In this paper, we propose an efficient algorithm named low overhead PET (LOPET) to partition the product lines. By applying our algorithm, both the area overhead and test length are reduced significantly. |
URI: | http://dx.doi.org/10.1109/12.237730 http://hdl.handle.net/11536/2948 |
ISSN: | 0018-9340 |
DOI: | 10.1109/12.237730 |
期刊: | IEEE TRANSACTIONS ON COMPUTERS |
Volume: | 42 |
Issue: | 7 |
起始頁: | 887 |
結束頁: | 891 |
Appears in Collections: | Articles |
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