標題: Magnetic force microscopy study of a defect-induced orthogonal magnetic structure on a cobalt film
作者: Lin, HN
Chang, CR
Chiou, YH
電子物理學系
Department of Electrophysics
關鍵字: magnetic force microscopy;double wall;spike domain;defects
公開日期: 1-Feb-2000
摘要: An unusual orthogonal magnetic structure is observed on a cobalt film by magnetic force microscopy. The structure is composed of a double wall, which is caused by a surface scratch, and two perpendicular spike domains, which are caused by an internal defect. The occurrence of the structure is attributed to the generation of surface free poles due to film inhomogeneities and their redistribution to reduce the magnetostatic energy. The magnetization pattern has also been proposed to explain the observed magnetic force image. (C) 2000 Elsevier Science B.V. All rights reserved.
URI: http://dx.doi.org/10.1016/S0304-8853(99)00703-9
http://hdl.handle.net/11536/30763
ISSN: 0304-8853
DOI: 10.1016/S0304-8853(99)00703-9
期刊: JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
Volume: 209
Issue: 1-3
起始頁: 243
結束頁: 245
Appears in Collections:Conferences Paper


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