Magnetic force microscopy study of a defect-induced orthogonal magnetic structure on a cobalt film

标题:	Magnetic force microscopy study of a defect-induced orthogonal magnetic structure on a cobalt film
作者:	Lin, HN Chang, CR Chiou, YH 电子物理学系 Department of Electrophysics
关键字:	magnetic force microscopy;double wall;spike domain;defects
公开日期:	1-二月-2000
摘要:	An unusual orthogonal magnetic structure is observed on a cobalt film by magnetic force microscopy. The structure is composed of a double wall, which is caused by a surface scratch, and two perpendicular spike domains, which are caused by an internal defect. The occurrence of the structure is attributed to the generation of surface free poles due to film inhomogeneities and their redistribution to reduce the magnetostatic energy. The magnetization pattern has also been proposed to explain the observed magnetic force image. (C) 2000 Elsevier Science B.V. All rights reserved.
URI:	http://dx.doi.org/10.1016/S0304-8853(99)00703-9 http://hdl.handle.net/11536/30763
ISSN:	0304-8853
DOI:	10.1016/S0304-8853(99)00703-9
期刊:	JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
Volume:	209
Issue:	1-3
起始页:	243
结束页:	245
显示于类别：	Conferences Paper

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APA	Lin, H., Chang, C., & Chiou, Y. (2000). Magnetic force microscopy study of a defect-induced orthogonal magnetic structure on a cobalt film. WOS:000085022700069.
Bibtex	@article{Lin2000Magnetic, title={Magnetic force microscopy study of a defect-induced orthogonal magnetic structure on a cobalt film}, author={Lin, HN and Chang, CR and Chiou, YH}, journal={WOS:000085022700069}, year={2000}, url={https://ir.lib.nycu.edu.tw/handle/11536/30763?locale=zh_CN}, }