標題: | Magnetic force microscopy study of a defect-induced orthogonal magnetic structure on a cobalt film |
作者: | Lin, HN Chang, CR Chiou, YH 電子物理學系 Department of Electrophysics |
關鍵字: | magnetic force microscopy;double wall;spike domain;defects |
公開日期: | 1-二月-2000 |
摘要: | An unusual orthogonal magnetic structure is observed on a cobalt film by magnetic force microscopy. The structure is composed of a double wall, which is caused by a surface scratch, and two perpendicular spike domains, which are caused by an internal defect. The occurrence of the structure is attributed to the generation of surface free poles due to film inhomogeneities and their redistribution to reduce the magnetostatic energy. The magnetization pattern has also been proposed to explain the observed magnetic force image. (C) 2000 Elsevier Science B.V. All rights reserved. |
URI: | http://dx.doi.org/10.1016/S0304-8853(99)00703-9 http://hdl.handle.net/11536/30763 |
ISSN: | 0304-8853 |
DOI: | 10.1016/S0304-8853(99)00703-9 |
期刊: | JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS |
Volume: | 209 |
Issue: | 1-3 |
起始頁: | 243 |
結束頁: | 245 |
顯示於類別: | 會議論文 |