標題: 2xVDD-tolerant crystal oscillator circuit realized with 1xVDD CMOS devices without gate-oxide reliability issue
作者: Ker, Ming-Dou
Wang, Tzu-Ming
Liao, Hung-Tai
電機學院
College of Electrical and Computer Engineering
公開日期: 2008
摘要: A new 2xVDD-tolerant crystal oscillator circuit realized with 1xVDD CMOS devices without suffering gate-oxide reliability issue is proposed, which is one of the key mixed-voltage I/O cells in a cell library. The proposed circuit is realized with only thin gate-oxide devices with floating n-well technique. The proposed 2xVDD-tolerant crystal oscillator circuit has been designed and verified in a 90-mn 1-V CMOS process to serve 1/2-V mixed-voltage interface applications.
URI: http://hdl.handle.net/11536/31253
ISBN: 978-1-4244-2078-0
ISSN: 0271-4302
期刊: PROCEEDINGS OF 2008 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1-10
起始頁: 820
結束頁: 823
Appears in Collections:Conferences Paper