標題: Small perturbation analysis of oblique incidence in dielectric gratings
作者: Hwang, RB
Jen, DK
電信工程研究所
Institute of Communications Engineering
關鍵字: dielectric gratings;periodic structure;small perturbation
公開日期: 20-Dec-1998
摘要: In this paper, the method of first-order perturbation is proposed to investigate the plane-wane scattering by dielectric gratings with a small modulation index at oblique incidence. Under the assumption of small perturbation, the cross coupling between the fields of the polarizations (TE and TM) due to the oblique incidence cart be represented by the TE and TM transmission lines fed by distributed current and (or) voltage sources, respectively. The results show good agreement with that obtained by a rigorous formulation. (C) 1998 John Wiley & Sons, Inc.
URI: http://hdl.handle.net/11536/31681
ISSN: 0895-2477
期刊: MICROWAVE AND OPTICAL TECHNOLOGY LETTERS
Volume: 19
Issue: 6
起始頁: 434
結束頁: 437
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