IMPROVEMENT OF ELECTRICAL CHARACTERISTICS OF POLYCRYSTALLINE SILICON-CONTACTED DIODES AFTER FORWARD BIAS STRESSING

doi:10.1063/1.104007

標題:	IMPROVEMENT OF ELECTRICAL CHARACTERISTICS OF POLYCRYSTALLINE SILICON-CONTACTED DIODES AFTER FORWARD BIAS STRESSING
作者:	WU, SL LEE, CL LEI, TF 交大名義發表電控工程研究所 National Chiao Tung University Institute of Electrical and Control Engineering
公開日期:	29-十月-1990
URI:	http://dx.doi.org/10.1063/1.104007 http://hdl.handle.net/11536/3984
ISSN:	0003-6951
DOI:	10.1063/1.104007
期刊:	APPLIED PHYSICS LETTERS
Volume:	57
Issue:	18
起始頁:	1904
結束頁:	1906
顯示於類別：	期刊論文