配向膜離子電荷殘留降低對顯示器之殘像研究

Abstract

配向在顯示器製作，具相當重要技術，一般以醯亞胺為PI材料，並以配向布摩擦，讓配向膜具微溝槽表面，進而讓液晶進行排列，但配向層的塗佈與機器的摩擦過程必然會留下些許的毛屑雜質等，使得液晶顯示器製作過程中產生電荷或異質殘留問題，而影響面板光電特性表現。 本論文，主要為研究為減輕液晶盒內離子殘留，改善面板象的現象，係利用離子濃度儀，測量面板液晶盒(Cell gap)內單位離子密度量及再透過色彩分析器(CA-210)檢測閃爍光學均勻性，最後將面板經由室溫(25度)進行點燈燒測10hrs確認。 其次，找出摩擦配向製程段易發生污染，探討分析，找出殘影與材料及製作流程的相關性，以改善面板的殘影缺陷問題。

In this thesis study effect of ion residue affect the Liquid crystal display (LCD),by using LCM3ionconcentration measure equipmente, discuss the relativity between ion density winthin cell gap and shadow defect. First of all, 3 different model LC and 2 PI will be include in this study,by experiment matrix to confirm ion residue defect between material. On the other hand, we also focus the frequently cause of polluted rubbing process. In this thesis will discuss how the relation between shadow defect and material,rubbing process. threrfor improve LCD displayer shadow defect.