標題: THE EFFECTS OF THERMAL SILICIDATION ON THE CURRENT TRANSPORT CHARACTERISTICS OF TI/(111)SI SCHOTTKY-BARRIER CONTACTS
作者: TSENG, HH
WU, CY
交大名義發表
工學院
National Chiao Tung University
College of Engineering
公開日期: 1-一月-1988
URI: http://hdl.handle.net/11536/4578
ISSN: 0038-1101
期刊: SOLID-STATE ELECTRONICS
Volume: 31
Issue: 1
起始頁: 35
結束頁: 44
顯示於類別:期刊論文