次微米N型MOS元件中反向短通道效應之模式及其特性分析

Full metadata record

DC Field	Value	Language
dc.contributor.author	鄭水明	en_US
dc.contributor.author	莊紹勳	en_US
dc.date.accessioned	2014-12-12T02:18:22Z	-
dc.date.available	2014-12-12T02:18:22Z	-
dc.date.issued	1996	en_US
dc.identifier.uri	http://140.113.39.130/cdrfb3/record/nctu/#NT856430121	en_US
dc.identifier.uri	http://hdl.handle.net/11536/62556	-
dc.language.iso	en_US	en_US
dc.title	次微米N型MOS元件中反向短通道效應之模式及其特性分析	zh_TW
dc.title	= Modeling and characterization of the reverse short channel effect in submicron n-MOSFET's	en_US
dc.type	Thesis	en_US
dc.contributor.department	電子研究所	zh_TW
Appears in Collections:	Thesis