標題: Transient-to-Digital Converter for System-Level Electrostatic Discharge Protection in CMOS ICs
作者: Ker, Ming-Dou
Yen, Cheng-Cheng
電機學院
College of Electrical and Computer Engineering
關鍵字: Converter;detection circuit;electromagnetic compatibility (EMC);electrostatic discharge (ESD);ESD protection circuit;system-level ESD test
公開日期: 1-Aug-2009
摘要: A new on-chip RC-based transient detection circuit for system-level electrostatic discharge (ESD) protection is proposed, which can detect fast electrical transients during the system-level ESD test. A novel on-chip transient-to-digital converter composed of four RC-based transient detection circuits and four different RC filter networks has been successfully designed and verified in a 0.18-mu m CMOS process with 3.3-V devices. The output digital thermometer codes of the proposed on-chip transient-to-digital converter correspond to different ESD voltages under system-level ESD tests. The proposed on-chip transient-to-digital converter can be further combined with firmware cooperation to provide an effective solution to solve the system-level ESD protection issue in microelectronic systems equipped with CMOS ICs.
URI: http://dx.doi.org/10.1109/TEMC.2009.2018124
http://hdl.handle.net/11536/6906
ISSN: 0018-9375
DOI: 10.1109/TEMC.2009.2018124
期刊: IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY
Volume: 51
Issue: 3
起始頁: 620
結束頁: 630
Appears in Collections:Articles


Files in This Item:

  1. 000269154400006.pdf

If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.