RF CMOS之特性量測、模式建立與可靠性研究

Full metadata record

DC Field	Value	Language
dc.contributor.author	汪大暉	en_US
dc.contributor.author	WANG TAHUI	en_US
dc.date.accessioned	2014-12-13T10:29:41Z	-
dc.date.available	2014-12-13T10:29:41Z	-
dc.date.issued	2000	en_US
dc.identifier.govdoc	NSC89-2215-E009-034	zh_TW
dc.identifier.uri	http://hdl.handle.net/11536/89519	-
dc.identifier.uri	https://www.grb.gov.tw/search/planDetail?id=542099&docId=99581	en_US
dc.description.sponsorship	行政院國家科學委員會	zh_TW
dc.language.iso	zh_TW	en_US
dc.subject	射頻	zh_TW
dc.subject	互補式金氧半導體	zh_TW
dc.subject	S-參數	zh_TW
dc.subject	雜訊	zh_TW
dc.subject	電路模式	zh_TW
dc.subject	天線效應	zh_TW
dc.subject	熱電子	zh_TW
dc.subject	RF	en_US
dc.subject	CMOS	en_US
dc.subject	S-parameter	en_US
dc.subject	Noise	en_US
dc.subject	Circuit model	en_US
dc.subject	Antenna effect	en_US
dc.subject	Hot carrier	en_US
dc.title	RF CMOS之特性量測、模式建立與可靠性研究	zh_TW
dc.title	RF CMOS Characterization, Modeling and Reliability Study	en_US
dc.type	Plan	en_US
dc.contributor.department	交通大學電子工程系	zh_TW
Appears in Collections:	Research Plans

Files in This Item:

If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.