完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | 汪大暉 | en_US |
dc.contributor.author | WANG TAHUI | en_US |
dc.date.accessioned | 2014-12-13T10:29:41Z | - |
dc.date.available | 2014-12-13T10:29:41Z | - |
dc.date.issued | 2000 | en_US |
dc.identifier.govdoc | NSC89-2215-E009-034 | zh_TW |
dc.identifier.uri | http://hdl.handle.net/11536/89519 | - |
dc.identifier.uri | https://www.grb.gov.tw/search/planDetail?id=542099&docId=99581 | en_US |
dc.description.sponsorship | 行政院國家科學委員會 | zh_TW |
dc.language.iso | zh_TW | en_US |
dc.subject | 射頻 | zh_TW |
dc.subject | 互補式金氧半導體 | zh_TW |
dc.subject | S-參數 | zh_TW |
dc.subject | 雜訊 | zh_TW |
dc.subject | 電路模式 | zh_TW |
dc.subject | 天線效應 | zh_TW |
dc.subject | 熱電子 | zh_TW |
dc.subject | RF | en_US |
dc.subject | CMOS | en_US |
dc.subject | S-parameter | en_US |
dc.subject | Noise | en_US |
dc.subject | Circuit model | en_US |
dc.subject | Antenna effect | en_US |
dc.subject | Hot carrier | en_US |
dc.title | RF CMOS之特性量測、模式建立與可靠性研究 | zh_TW |
dc.title | RF CMOS Characterization, Modeling and Reliability Study | en_US |
dc.type | Plan | en_US |
dc.contributor.department | 交通大學電子工程系 | zh_TW |
顯示於類別: | 研究計畫 |