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公開日期標題作者
1-一月-2015Investigation of Backgate-Biasing Effect for Ultrathin-Body III-V Heterojunction Tunnel FETFan, Ming-Long; Hu, Vita Pi-Ho; Hsu, Chih-Wei; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2016Investigation of BTI Reliability for Monolithic 3D 6T SRAM with Ultra-thin-body GeOI MOSFETsHu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-六月-2010Investigation of Cell Stability and Write Ability of FinFET Subthreshold SRAM Using Analytical SNM ModelFan, Ming-Long; Wu, Yu-Sheng; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te; 交大名義發表; National Chiao Tung University
1-四月-2009Investigation of electrostatic integrity for ultra-thin-body GeOI MOSFET using analytical solution of Poisson's equationHu, Vita Pi-Ho; Wu, Yu-Sheng; Su, Pin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2008Investigation of Electrostatic Integrity for Ultra-Thin-Body GeOI MOSFET Using Analytical Solution of Poisson's EquationHu, Vita Pi-Ho; Wu, Yu-Sheng; Su, Pin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-三月-2011Investigation of Electrostatic Integrity for Ultrathin-Body Germanium-On-Nothing MOSFETHu, Vita Pi-Ho; Wu, Yu-Sheng; Su, Pin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2013Investigation of Single-Trap-Induced Random Telegraph Noise for Tunnel FET Based Devices, 8T SRAM Cell, and Sense AmplifiersFan, Ming-Long; Hu, Vita Pi-Ho; Chen, Yin-Nien; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2009Investigation of Static Noise Margin of FinFET SRAM Cells in Sub-threshold RegionFan, Ming-Long; Wu, Yu-Sheng; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2009Investigation of Static Noise Margin of Ultra-Thin-Body SOI SRAM Cells in Subthreshold Region using Analytical Solution of Poisson's EquationHu, Vita Pi-Ho; Wu, Yu-Sheng; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-四月-2014Single-trap-induced random telegraph noise for FinFET, Si/Ge Nanowire FET, Tunnel FET, SRAM and logic circuitsFan, Ming-Long; Yang, Shao-Yu; Hu, Vita Pi-Ho; Chen, Yin-Nien; Su, Pin; Chuang, Ching-Te; 交大名義發表; National Chiao Tung University
1-十月-2014Stability and Performance Optimization of Heterochannel Monolithic 3-D SRAM Cells Considering Interlayer CouplingFan, Ming-Long; Hu, Vita Pi-Ho; Chen, Yin-Nien; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2014Stability/Performance Assessment of Monolithic 3D 6T/ST SRAM Cells Considering Transistor-Level Interlayer CouplingFan, Ming-Long; Hu, Vita Pi-Ho; Chen, Yin-Nien; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-九月-2009Static Noise Margin of Ultrathin-Body SOI Subthreshold SRAM Cells-An Assessment Based on Analytical Solutions of Poisson's EquationHu, Vita Pi-Ho; Wu, Yu-Sheng; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2013Threshold Voltage Design and Performance Assessment of Hetero-Channel SRAM CellsHu, Vita Pi-Ho; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-七月-2013Threshold Voltage Design of UTB SOI SRAM With Improved Stability/Variability for Ultralow Voltage Near Subthreshold OperationHu, Vita Pi-Ho; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2014Ultra-Low Voltage Mixed TFET-MOSFET 8T SRAM CellChen, Yin-Nien; Fan, Ming-Long; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2015UTB GeOI 6T SRAM Cell and Sense Amplifier considering BTI ReliabilityHu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十二月-2012Variability Analysis of Sense Amplifier for FinFET Subthreshold SRAM ApplicationsFan, Ming-Long; Hu, Vita Pi-Ho; Chen, Yin-Nien; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十二月-2012Variability Analysis of Sense Amplifier for FinFET Subthreshold SRAM ApplicationsFan, Ming-Long; Hu, Vita Pi-Ho; Chen, Yin-Nien; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
顯示 41 到 59 筆資料，總共 59 筆 < 上一頁