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Showing results 41 to 60 of 124 < previous   next >
Issue DateTitleAuthor(s)
1997Functional test pattern generation for CMOS operational amplifierChang, SJ; Lee, CL; Chen, JE; 交大名義發表; 電子工程學系及電子研究所; National Chiao Tung University; Department of Electronics Engineering and Institute of Electronics
1-Jan-2003Growing high-performance tunneling oxide by CF4 plasma pretreatmentChang, TY; Lee, JW; Lei, TF; Lee, CL; Wen, HC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Apr-2001High reliability polyoxide fabricated by using TEOS oxide deposited on disilane polysilicon filmLee, JW; Lee, CL; Lei, TF; Lai, CS; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Dec-2003High reliability ultrathin interpolyoxynitride dielectrics prepared by N2O plasma annealingWang, JC; Lee, JW; Kuo, LT; Lei, TF; Lee, CL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1996A high speed circuit scheme for driving field emission arrayLu, CW; Lee, CL; Huang, JM; 交大名義發表; 電子工程學系及電子研究所; National Chiao Tung University; Department of Electronics Engineering and Institute of Electronics
1-Oct-1996High-resolution MOS magnetic sensor with thin oxide in standard submicron CMOS processYang, HM; Huang, YC; Lei, TF; Lee, CL; Chao, SC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-May-2003Highly reliable nickel silicide formation with a Zr capping layerLee, TL; Lee, JW; Lee, MC; Lei, TF; Lee, CL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jun-1997Hydrogen and oxygen plasma effects on polycrystalline silicon thin films of various thicknessesLiou, BW; Lee, CL; Lei, TF; Wu, YH; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Sep-1997Identification of robust untestable path delay faultsWu, WC; Lee, CL; Chen, JE; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Sep-1997Identifying invalid states for sequential circuit test generationLiang, HC; Lee, CL; Chen, JE; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Sep-1997Identifying invalid states for sequential circuit test generationLiang, HC; Lee, CL; Chen, JE; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Feb-2004Improved characteristics of ultrathin CeO2 by using postnitridation annealingWang, JC; Hung, YP; Lee, CL; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005Improvement of junction leakage by using a Zr cap layer on a 30 nm ultrashallow nickel-silicide junctionLee, TL; Lee, MZ; Lei, TF; Lee, CL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Oct-1998Improvement of reliability of metal-oxide semiconductor field-effect transistors with N2O nitrided gate oxide and N2O polysilicon gate reoxidationLai, CS; Chao, TS; Lei, TF; Lee, CL; Huang, TY; Chang, CY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Oct-1998Improvement of reliability of metal-oxide semiconductor field-effect transistors with N2O nitrided gate oxide and N2O polysilicon gate reoxidationLai, CS; Chao, TS; Lei, TF; Lee, CL; Huang, TY; Chang, CY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Sep-2001Improvements in both thermal stability of Ni-silicide and electrical reliability of gate oxides using a stacked polysilicon gate structureLee, JW; Lin, SX; Lei, TF; Lee, CL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1996Invalid state identification for sequential circuit test generationLiang, HC; Lee, CL; Chen, JE; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jan-1997Investigation of the polarity asymmetry on the electrical characteristics of thin polyoxides grown on N+ polysiliconWu, SL; Chen, CY; Lin, TY; Lee, CL; Lei, TF; Liang, MS; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-May-2001Isolation on Si wafers by MeV proton bombardment for RF integrated circuitsLee, LS; Liao, CP; Lee, CL; Huang, TH; Tang, DDL; Duh, TS; Yang, TT; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2004Long-period fiber grating filter synthesis using evolutionary programmingLee, CL; Lai, YC; 光電工程學系; Department of Photonics
Showing results 41 to 60 of 124 < previous   next >