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公開日期
標題
作者
1-四月-2012
Abnormal Subthreshold Leakage Current at High Temperature in InGaZnO Thin-Film Transistors
Chang, Geng-Wei
;
Chang, Ting-Chang
;
Jhu, Jhe-Ciou
;
Tsai, Tsung-Ming
;
Syu, Yong-En
;
Chang, Kuan-Chang
;
Tai, Ya-Hsiang
;
Jian, Fu-Yen
;
Hung, Ya-Chi
;
光電工程學系
;
Department of Photonics
十月-2016
Adjustable built-in resistor on oxygen-vacancy-rich electrode-capped resistance random access memory
Pan, Chih-Hung
;
Chang, Ting-Chang
;
Tsai, Tsung-Ming
;
Chang, Kuan-Chang
;
Chu, Tian-Jian
;
Chen, Po-Hsun
;
Chen, Min-Chen
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-六月-2017
Analysis of Contrasting Degradation Behaviors in Channel and Drift Regions Under Hot Carrier Stress in PDSOI LD N-Channel MOSFETs
Lin, Chien-Yu
;
Chang, Ting-Chang
;
Liu, Kuan-Ju
;
Chen, Li-Hui
;
Tsai, Jyun-Yu
;
Chen, Ching-En
;
Lu, Ying-Hsin
;
Liu, Hsi-Wen
;
Liao, Jin-Chien
;
Chang, Kuan-Chang
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-三月-2012
Asymmetric Carrier Conduction Mechanism by Tip Electric Field in WSiOX Resistance Switching Device
Syu, Yong-En
;
Chang, Ting-Chang
;
Tsai, Tsung-Ming
;
Chang, Geng-Wei
;
Chang, Kuan-Chang
;
Lou, Jyun-Hao
;
Tai, Ya-Hsiang
;
Tsai, Ming-Jinn
;
Wang, Ying-Lang
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
光電工程學系
;
Department of Electronics Engineering and Institute of Electronics
;
Department of Photonics
29-四月-2013
Atomic-level quantized reaction of HfOx memristor
Syu, Yong-En
;
Chang, Ting-Chang
;
Lou, Jyun-Hao
;
Tsai, Tsung-Ming
;
Chang, Kuan-Chang
;
Tsai, Ming-Jinn
;
Wang, Ying-Lang
;
Liu, Ming
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
7-七月-2017
Attaining resistive switching characteristics and selector properties by varying forming polarities in a single HfO2-based RRAM device with a vanadium electrode
Lin, Chih-Yang
;
Chen, Po-Hsun
;
Chang, Ting-Chang
;
Chang, Kuan-Chang
;
Zhang, Sheng-Dong
;
Tsai, Tsung-Ming
;
Pan, Chih-Hung
;
Chen, Min-Chen
;
Su, Yu-Ting
;
Tseng, Yi-Ting
;
Chang, Yao-Feng
;
Chen, Ying-Chen
;
Huang, Hui-Chun
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-十二月-2012
Bipolar Resistive RAM Characteristics Induced by Nickel Incorporated Into Silicon Oxide Dielectrics for IC Applications
Tsai, Tsung-Ming
;
Chang, Kuan-Chang
;
Chang, Ting-Chang
;
Syu, Yong-En
;
Chuang, Siang-Lan
;
Chang, Geng-Wei
;
Liu, Guan-Ru
;
Chen, Min-Chen
;
Huang, Hui-Chun
;
Liu, Shih-Kun
;
Tai, Ya-Hsiang
;
Gan, Der-Shin
;
Yang, Ya-Liang
;
Young, Tai-Fa
;
Tseng, Bae-Heng
;
Chen, Kai-Huang
;
Tsai, Ming-Jinn
;
Ye, Cong
;
Wang, Hao
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
光電工程學系
;
Department of Electronics Engineering and Institute of Electronics
;
Department of Photonics
1-三月-2013
Characteristics and Mechanisms of Silicon-Oxide-Based Resistance Random Access Memory
Chang, Kuan-Chang
;
Tsai, Tsung-Ming
;
Chang, Ting-Chang
;
Wu, Hsing-Hua
;
Chen, Jung-Hui
;
Syu, Yong-En
;
Chang, Geng-Wei
;
Chu, Tian-Jian
;
Liu, Guan-Ru
;
Su, Yu-Ting
;
Chen, Min-Chen
;
Pan, Jhih-Hong
;
Chen, Jian-Yu
;
Tung, Cheng-Wei
;
Huang, Hui-Chun
;
Tai, Ya-Hsiang
;
Gan, Der-Shin
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
光電工程學系
;
Department of Electronics Engineering and Institute of Electronics
;
Department of Photonics
14-十月-2013
Characteristics of hafnium oxide resistance random access memory with different setting compliance current
Su, Yu-Ting
;
Chang, Kuan-Chang
;
Chang, Ting-Chang
;
Tsai, Tsung-Ming
;
Zhang, Rui
;
Lou, J. C.
;
Chen, Jung-Hui
;
Young, Tai-Fa
;
Chen, Kai-Huang
;
Tseng, Bae-Heng
;
Shih, Chih-Cheng
;
Yang, Ya-Liang
;
Chen, Min-Chen
;
Chu, Tian-Jian
;
Pan, Chih-Hung
;
Syu, Yong-En
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-六月-2014
Characterization of Oxygen Accumulation in Indium-Tin-Oxide for Resistance Random Access Memory
Zhang, Rui
;
Chang, Kuan-Chang
;
Chang, Ting-Chang
;
Tsai, Tsung-Ming
;
Huang, Syuan-Yong
;
Chen, Wen-Jen
;
Chen, Kai-Huang
;
Lou, Jen-Chung
;
Chen, Jung-Hui
;
Young, Tai-Fa
;
Chen, Min-Chen
;
Chen, Hsin-Lu
;
Liang, Shu-Ping
;
Syu, Yong-En
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-四月-2013
Charge Quantity Influence on Resistance Switching Characteristic During Forming Process
Chu, Tian-Jian
;
Chang, Ting-Chang
;
Tsai, Tsung-Ming
;
Wu, Hsing-Hua
;
Chen, Jung-Hui
;
Chang, Kuan-Chang
;
Young, Tai-Fa
;
Chen, Kai-Hsang
;
Syu, Yong-En
;
Chang, Geng-Wei
;
Chang, Yao-Feng
;
Chen, Min-Chen
;
Lou, Jyun-Hao
;
Pan, Jhih-Hong
;
Chen, Jian-Yu
;
Tai, Ya-Hsiang
;
Ye, Cong
;
Wang, Hao
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
光電工程學系
;
Department of Electronics Engineering and Institute of Electronics
;
Department of Photonics
26-十月-2017
Conduction Mechanism and Improved Endurance in HfO2-Based RRAM with Nitridation Treatment
Yuan, Fang-Yuan
;
Deng, Ning
;
Shih, Chih-Cheng
;
Tseng, Yi-Ting
;
Chang, Ting-Chang
;
Chang, Kuan-Chang
;
Wang, Ming-Hui
;
Chen, Wen-Chung
;
Zheng, Hao-Xuan
;
Wu, Huaqiang
;
Qian, He
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
26-九月-2016
Confirmation of filament dissolution behavior by analyzing electrical field effect during reset process in oxide-based RRAM
Pan, Chih-Hung
;
Chang, Ting-Chang
;
Tsai, Tsung-Ming
;
Chang, Kuan-Chang
;
Chu, Tian-Jian
;
Lin, Wen-Yan
;
Chen, Min-Chen
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
10-九月-2012
Dehydroxyl effect of Sn-doped silicon oxide resistance random access memory with supercritical CO2 fluid treatment
Tsai, Tsung-Ming
;
Chang, Kuan-Chang
;
Chang, Ting-Chang
;
Syu, Yong-En
;
Liao, Kuo-Hsiao
;
Tseng, Bae-Heng
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
腦科學研究中心
;
Department of Electronics Engineering and Institute of Electronics
;
Brain Research Center
6-三月-2017
The effect of asymmetrical electrode form after negative bias illuminated stress in amorphous IGZO thin film transistors
Su, Wan-Ching
;
Chang, Ting-Chang
;
Liao, Po-Yung
;
Chen, Yu-Jia
;
Chen, Bo-Wei
;
Hsieh, Tien-Yu
;
Yang, Chung-I
;
Huang, Yen-Yu
;
Chang, Hsi-Ming
;
Chiang, Shin-Chuan
;
Chang, Kuan-Chang
;
Tsai, Tsung-Ming
;
電子物理學系
;
Department of Electrophysics
10-四月-2017
The effect of asymmetrical electrode form after negative bias illuminated stress in amorphous IGZO thin film transistors (vol 110, 103502, 2017)
Su, Wan-Ching
;
Chang, Ting-Chang
;
Liao, Po-Yung
;
Chen, Yu-Jia
;
Chen, Bo-Wei
;
Hsieh, Tien-Yu
;
Yang, Chung-I
;
Huang, Yen-Yu
;
Chang, Hsi-Ming
;
Chiang, Shin-Chuan
;
Chang, Kuan-Chang
;
Tsai, Tsung-Ming
;
電子物理學系
;
Department of Electrophysics
1-五月-2017
Effect of charge quantity on conduction mechanism of high-and low-resistance states during forming process in a one-transistor-one-resistor resistance random access memory
Wu, Cheng-Hsien
;
Chang, Ting-Chang
;
Tsai, Tsung-Ming
;
Chang, Kuan-Chang
;
Chu, Tian-Jian
;
Pan, Chih-Hung
;
Su, Yu-Ting
;
Chen, Po-Hsun
;
Lin, Shih-Kai
;
Hu, Shih-Jie
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
15-五月-2017
The effect of device electrode geometry on performance after hot-carrier stress in amorphous In-Ga-Zn-O thin film transistors with different via-contact structures
Liao, Po-Yung
;
Chang, Ting-Chang
;
Chen, Yu-Jia
;
Su, Wan-Ching
;
Chen, Bo-Wei
;
Chen, Li-Hui
;
Hsieh, Tien-Yu
;
Yang, Chung-Yi
;
Chang, Kuan-Chang
;
Zhang, Sheng-Dong
;
Huang, Yen-Yu
;
Chang, Hsi-Ming
;
Chiang, Shin-Chuan
;
電子物理學系
;
Department of Electrophysics
三月-2016
Effect of different constant compliance current for hopping conduction distance properties of the Sn:SiOx thin film RRAM devices
Chen, Kai-Huang
;
Chang, Kuan-Chang
;
Chang, Ting-Chang
;
Tsai, Tsung-Ming
;
Liao, Kuo-Hsiao
;
Syu, Yong-En
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-一月-2013
Effect of Electrode Material on Resistive Switching Characteristics in TaON Nonvolatile Memory Devices
Chen, Min-Chen
;
Chang, Ting-Chang
;
Chiu, Yi-Chieh
;
Chen, Shih-Cheng
;
Huang, Sheng-Yao
;
Syu, Yong-En
;
Chang, Kuan-Chang
;
Huang, Hui-Chun
;
Tsai, Tsung-Ming
;
Gan, Der-Shin
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics