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公開日期標題作者
1-五月-2002Broadcasting cryptosystem in computer networks using geometric properties of linesHwang, MS; Lee, CC; Chang, TY; 資訊工程學系; Department of Computer Science
15-四月-1999The construction of production performance prediction system for semiconductor manufacturing with artificial neural networksHuang, CL; Huang, YH; Chang, TY; Chang, SH; Chung, CH; Huang, DT; Li, RK; 工業工程與管理學系; Department of Industrial Engineering and Management
1-六月-2004Cryptanalysis of publicly verifiable authenticated encryptionChang, TY; Yang, CC; Hwang, MS; 資訊工程學系; Department of Computer Science
1-八月-2004Cryptanalysis of simple authenticated key agreement protocolsYang, CC; Chang, TY; Hwang, MS; 資訊工程學系; Department of Computer Science
15-十二月-2005Cryptanalysis of the improved authenticated key agreement protocolChang, TY; Yang, CC; Yang, YW; 資訊工程學系; Department of Computer Science
1-九月-2005Drain/gate-voltage-dependent on-current and off-current instabilities in polycrystalline silicon thin-film transistors under electrical stressWang, SD; Chang, TY; Lo, WH; Sang, JY; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十二月-2002Effect of CF4 plasma pretreatment on low temperature oxidesChang, TY; Chen, HW; Lei, TF; Chao, TS; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2003Growing high-performance tunneling oxide by CF4 plasma pretreatmentChang, TY; Lee, JW; Lei, TF; Lee, CL; Wen, HC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-八月-2002Impact of nitrogen and/or fluorine implantation on deep-submicron Co-salicide processChang, TY; Lei, TF; Chao, TS; Chen, SW; Kao, LM; Chen, SK; Tuan, A; Su, TP; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-七月-2002Improvement of low-temperature gate dielectric formed in N2O plasma by an additional CF4 pretreatment processChang, TY; Lei, TF; Chao, TS; Wen, HC; Chen, HW; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
25-三月-2005An improvement of the Yang-Shieh password authentication schemesYang, CC; Wang, RC; Chang, TY; 資訊工程學系; Department of Computer Science
1-四月-1999Improvement of ultra-thin 3.3 nm thick oxide for co-salicide process using NF3 annealed poly-gateChang, TY; Lei, TF; Chao, TS; Huang, CT; Chen, SK; Tuan, A; Chou, S; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2004Improvement on pretty-simple password authenticated key-exchange protocol for wireless networksChang, TY; Yang, CC; Chen, CM; 資訊工程學系; Department of Computer Science
5-四月-2005An improvement on the Lin-Wu (t, n) threshold verifiable multi-secret sharing schemeChang, TY; Hwang, MS; Yang, WP; 資訊工程學系; Department of Computer Science
1-九月-2001An investigation of scanning capacitance microscopy on iron-contaminated p-type siliconChang, MN; Chang, TY; Pan, FM; Wu, BW; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005Mechanism of on-current and off-current instabilities under electrical stress in polycrystalline silicon thin-film transistorsDe Wang, S; Chang, TY; Lo, WH; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-六月-2005Mobile IP assistance in ad hoc routing security using geometric properties of linesChang, TY; Yang, CC; Chen, CM; 資訊工程學系; Department of Computer Science
2005A new observation of the germanium outdiffusion effect on the hot carrier and NBTI reliabilities in sub-100nm technology strained-Si/SiGe CMOS devicesChung, SS; Liu, YR; Yeh, CF; Wu, SR; Lai, CS; Chang, TY; Ho, JH; Liu, CY; Huang, CT; Tsai, CT; Shiau, WT; Sun, SW; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-六月-2005A novel process-compatible fluorination technique with electrical characteristic improvements of poly-Si TFTsWang, SD; Lo, WH; Chang, TY; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-八月-2002Observation of differential capacitance images on slightly iron-contaminated p-type siliconChang, MN; Chen, CY; Pan, FM; Chang, TY; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
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