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20030.13 mu m low voltage logic based RF CMOS technology with 115GHz f(T) and 80GHz f(MAX)Guo, JC; Huang, CH; Chan, KT; Lien, WY; Wu, CM; Sun, YC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-五月-20040.13-mu m low-kappa-Cu CMOS logic-based technology for 2.1-Gb high data rate read-channelGuo, JC; Lien, WY; Tsai, TL; Chen, SM; Wu, CM; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十二月-20040.13-mu m RF CMOS and varactors performance optimization by multiple gate layoutsHo, CC; Kuo, CW; Chan, Y; Lien, WY; Guo, JC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-三月-2006A broadband and scalable model for on-chip inductors incorporating substrate and conductor loss effectsGuo, JC; Tan, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005A broadband and scalable model for on-chip inductors incorporating substrate and conductor loss effectsGuo, JC; Tan, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1995Direct observation of the lateral nonuniform channel doping profile in submicron MOSFET's from an anomalous charge pumping measurement resultsChung, SS; Cheng, SM; Lee, GH; Guo, JC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005A lossy substrate model for sub-100nm, super-100 GHz f(T) RF CMOS noise extraction and modelingGuo, JC; Lin, YM; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005Low-power and high-linearity mixer design using complex transconductance equivalent circuitZhan, WC; Kuo, CN; Guo, JC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1996Mechanisms and characteristics of oxide charge detrapping in n-MOSFET'sWang, TH; Chang, TE; Chiang, LP; Huang, CM; Guo, JC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-二月-2006A new lossy substrate de-embedding method for sub-100 nm RF CMOS noise extraction and modelingGuo, JC; Lin, YM; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-八月-2004Pocket implantation effect on drain current flicker noise in analog nMOSFET devicesWu, JW; Cheng, CC; Chiu, KL; Guo, JC; Lien, WY; Chang, CS; Huang, GW; Wang, TH; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2004A simple transmission line de-embedding method for accurate RF CMOS noise modelingGuo, JC; Huang, CH; Lien, WY; Wu, CM; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
顯示 1 到 12 筆資料，總共 12 筆