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公開日期標題作者
1-九月-1999Bipartite Steinhaus graphsLee, YS; Chang, GJ; 應用數學系; Department of Applied Mathematics
28-三月-1999Characterizations of bipartite Steinhaus graphsChang, GJ; DasGupta, B; Dymacek, WM; Furer, M; Koerlin, M; Lee, YS; Whaley, T; 應用數學系; Department of Applied Mathematics
1-七月-1998Comparison of N-2 and NH3 plasma passivation effects on polycrystalline silicon thin-film transistorsLee, YS; Lin, HY; Lei, TF; Huang, TY; Chang, TC; Chang, CY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2000Construction of error resilient synchronization codeword for variable-length code in image transmissionLee, YS; Chang, WS; Ho, HH; Lee, CY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-二月-1998Correlation of grain boundary characteristics with electrical properties in ZnO-glass varistorsLee, YS; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
29-一月-2000The effects of microcrystalline silicon film structure on low-high-low band-gap thin film transistorChang, CY; Lee, YS; Huang, TY; Shih, PS; Lin, CW; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-四月-1997Effects of spinel phase formation in the calcination process on the characteristics of ZnO-glass varistorsLee, YS; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-四月-1997Effects of spinel phase formation in the calcination process on the characteristics of ZnO-glass varistorsLee, YS; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2002Error resilient image coding and smart post-processing error concealment for wireless image transmissionOng, KK; Lee, YS; Lee, CY; 交大名義發表; National Chiao Tung University
1-二月-2003Error-resilient image coding (ERIC) with smart-IDCT error concealment technique for wireless multimedia transmissionLee, YS; Ong, KK; Lee, CY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2001A GaAs/AlAs wet selective etch process for the gate recess of GaAs power metal-semiconductor field-effect transistorsChang, EY; Lai, YL; Lee, YS; Chen, SH; 材料科學與工程學系; Department of Materials Science and Engineering
1-六月-1999A generalized prediction method for modified memory-based high throughput VLC decoder designLee, YS; Shieh, BJ; Lee, CY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1998High performance thin-film transistors with low-high-low band gap engineeringChang, CY; Lee, YS; Shih, PS; Lin, CW; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2002A high throughput context-based adaptive arithmetic codec for JPEG2000Ong, KK; Chang, WH; Tseng, YC; Lee, YS; Lee, CY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2002A high throughput low cost context-based adaptive arithmetic codec for multiple standardsOng, KK; Chang, WH; Tseng, YC; Lee, YS; Lee, CY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1998A high throughput variable length decoder with modified memory based architectureShieh, BJ; Lee, YS; Lee, CY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-六月-2001High-performance low-temperature poly-Si TFTs crystallized by excimer laser irradiation with recessed-channel structureLin, CW; Cheng, LJ; Lu, YL; Lee, YS; Cheng, HC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十二月-2000A high-throughput memory-based VLC decoder with codeword boundary predictionShieh, BJ; Lee, YS; Lee, CY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1999Highly selective etch process for the manufacture of GaAs power MESFET'sChang, EY; Lai, YL; Lee, YS; 材料科學與工程學系; Department of Materials Science and Engineering
2000HVLC: Error correctable hybrid variable length code for image coding in wireless transmissionLee, YS; Yu, CM; Chang, WS; Lee, CY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
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