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公開日期標題作者
20083D Modeling of Flood Induced Flows and Sediment Concentration in Shihmen ReservoirWang, K. H.; Yang, J. C.; Wu, C. H.; 土木工程學系; Department of Civil Engineering
1-七月-2014Box-Cox Transformation Approach for Evaluating Non-Normal Processes Capability Based on the C-pk IndexWu, C. H.; Lin, S. J.; Yang, D. L.; Pearn, W. L.; 工業工程與管理學系; Department of Industrial Engineering and Management
1-七月-2013A Close Form Solution for the Product Acceptance Determination Based on the Popular Index C-pkPearn, W. L.; Wu, C. H.; 工業工程與管理學系; Department of Industrial Engineering and Management
1-十二月-2018Development of rapid and ultrasensitive flexible palladium nano-thin film biosensing electrode for V. Orientalis detectionWu, C. H.; Huang, Y. Z.; Chang, C. Y.; Chang, C. H.; 生物科技學系; Department of Biological Science and Technology
1-七月-2018Effect of Selenization Processes on CIGS Solar Cell PerformanceWu, C. H.; Wu, P. W.; Chen, J. H.; Kao, J. Y.; Hsu, C. Y.; 材料科學與工程學系; Department of Materials Science and Engineering
1-十一月-2014An Effective Procedure for Supplier Selection Applied to Glass Substrate Processes with Multiple LinesPearn, W. L.; Wu, C. H.; Chuang, C. C.; 工業工程與管理學系; Department of Industrial Engineering and Management
15-十月-2011Effects of rapid thermal annealing on the structural properties of TiO(2) nanotubesLin, J. Y.; Chou, Y. T.; Shen, J. L.; Yang, M. D.; Wu, C. H.; Chi, G. C.; Chou, W. C.; Ko, C. H.; 電子物理學系; 光電工程學系; Department of Electrophysics; Department of Photonics
15-十月-2011Effects of rapid thermal annealing on the structural properties of TiO2 nanotubesLin, J. Y.; Chou, Y. T.; Shen, J. L.; Yang, M. D.; Wu, C. H.; Chi, G. C.; Chou, W. C.; Ko, C. H.; 電子物理學系; 光電工程學系; Department of Electrophysics; Department of Photonics
1-一月-2015Enhancement of light emission in GaAs epilayers with graphene quantum dotsLin, T. N.; Chih, K. H.; Cheng, M. C.; Yuan, C. T.; Hsu, C. L.; Shen, J. L.; Hou, J. L.; Wu, C. H.; Chou, W. C.; Lin, T. Y.; 電子物理學系; Department of Electrophysics
2016Enhancement-Mode GaN MIS-HEMTs with HfLaOx Gate InsulatorLin, Y. C.; Lin, J. C.; Lin, Y.; Wu, C. H.; Huang, Y. X.; Liu, S. C.; Hsu, H. T.; Hsieh, T. E.; Kakushima, K.; Iwai, H.; Chang, E. Y.; 材料科學與工程學系; 國際半導體學院; Department of Materials Science and Engineering; International College of Semiconductor Technology
1-七月-2015Estimating Process Capability Index C-p with Various Sample Types: A Practical ImplementationWu, C. H.; Pearn, W. L.; 工業工程與管理學系; Department of Industrial Engineering and Management
2016Evaluation of GaN HEMT with Field Plate for Reliability ImprovementLin, Y. C.; Lin, J. C.; Lin, Y.; Wu, C. H.; Chin, P. C.; Hsu, H. T.; Hsieh, T. E.; Iwai, H.; Chang, E. Y.; 材料科學與工程學系; 國際半導體學院; Department of Materials Science and Engineering; International College of Semiconductor Technology
1-三月-2013An Extension of the Product Acceptance Determination for One-Sided Process with Multiple CharacteristicsPearn, W. L.; Wu, C. H.; Hung, H. N.; Kao, C. M.; 統計學研究所; 工業工程與管理學系; Institute of Statistics; Department of Industrial Engineering and Management
1-十一月-2010Gate-First TaN/La(2)O(3)/SiO(2)/Ge n-MOSFETs Using Laser AnnealingChen, W. B.; Wu, C. H.; Shie, B. S.; Chin, Albert; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十一月-2010Gate-First TaN/La2O3/SiO2/Ge n-MOSFETs Using Laser AnnealingChen, W. B.; Wu, C. H.; Shie, B. S.; Chin, Albert; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-九月-2006HfSiON n-MOSFETs using low-work function HfSi chi gateWu, C. H.; Hung, B. F.; Chin, Albert; Wang, S. J.; Yen, F. Y.; Hou, Y. T.; Jin, Y.; Tao, H. J.; Chen, S. C.; Liang, M. S.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2006High temperature stable [Ir3Si-TaN]/HfLaON CMOS with large work-function differenceWu, C. H.; Hung, B. F.; Chin, Albert; Wang, S. J.; Chen, W. J.; Wang, X. P.; Li, M. -F.; Zhu, C.; Jin, Y.; Tao, H. J.; Chen, S. C.; Liang, M. S.; 奈米科技中心; Center for Nanoscience and Technology
1-四月-2007High-temperature stable HfLaON p-MOSFETs with high-work-function Ir3Si gateWu, C. H.; Hung, B. F.; Chin, Albert; Wang, S. J.; Wang, X. P.; Li, M. -F.; Zhu, C.; Yen, F. Y.; Hou, Y. T.; Jin, Y.; Tao, H. J.; Chen, S. C.; Liang, M. S.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-二月-2007High-temperature stable IrxSi gates with high work function on HfSiON p-MOSFETsHung, B. F.; Wu, C. H.; Chin, Albert; Wang, S. J.; Yen, F. Y.; Hou, Y. T.; Jin, Y.; Tao, H. J.; Chen, Shih C.; Liang, Mong-Song; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十二月-2007HtLaON n-MOSFETs using a low work function HfSix gateCheng, C. F.; Wu, C. H.; Su, N. C.; Wang, S. J.; McAlister, S. P.; Chin, Albert; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
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