標題: | Investigation on SCR-based ESD protection device for biomedical integrated circuits in a 0.18-mu m CMOS process |
作者: | Lin, Chun-Yu Chiu, Yan-Lian 生醫電子轉譯研究中心 Biomedical Electronics Translational Research Center |
關鍵字: | Biomedical;CMOS;Electrostatic discharge (ESD);Silicon-controlled rectifier (SCR) |
公開日期: | 1-十一月-2015 |
摘要: | In these decades, integrated circuits for biomedical electronics applications have been designed and implemented in CMOS technologies. In order to be safely used by human, all microelectronic products must meet the reliability specifications. Therefore, electrostatic discharge (ESD) must be taken into consideration. To protect the biomedical integrated circuits in CMOS technologies from ESD damage, a dual-directional silicon-controlled rectifier (DDSCR) device was presented in this work. Experimental results show that the DDSCR has the advantages of high ESD robustness, low leakage, large swing tolerance, and good latchup immunity. The DDSCR was suitable for ESD protection in biomedical integrated circuits. (C) 2015 Elsevier Ltd. All rights reserved. |
URI: | http://dx.doi.org/10.1016/j.microrel.2015.02.020 http://hdl.handle.net/11536/129777 |
ISSN: | 0026-2714 |
DOI: | 10.1016/j.microrel.2015.02.020 |
期刊: | MICROELECTRONICS RELIABILITY |
Volume: | 55 |
Issue: | 11 |
起始頁: | 2229 |
結束頁: | 2235 |
顯示於類別: | 會議論文 |