標題: Investigation on SCR-based ESD protection device for biomedical integrated circuits in a 0.18-mu m CMOS process
作者: Lin, Chun-Yu
Chiu, Yan-Lian
生醫電子轉譯研究中心
Biomedical Electronics Translational Research Center
關鍵字: Biomedical;CMOS;Electrostatic discharge (ESD);Silicon-controlled rectifier (SCR)
公開日期: 1-Nov-2015
摘要: In these decades, integrated circuits for biomedical electronics applications have been designed and implemented in CMOS technologies. In order to be safely used by human, all microelectronic products must meet the reliability specifications. Therefore, electrostatic discharge (ESD) must be taken into consideration. To protect the biomedical integrated circuits in CMOS technologies from ESD damage, a dual-directional silicon-controlled rectifier (DDSCR) device was presented in this work. Experimental results show that the DDSCR has the advantages of high ESD robustness, low leakage, large swing tolerance, and good latchup immunity. The DDSCR was suitable for ESD protection in biomedical integrated circuits. (C) 2015 Elsevier Ltd. All rights reserved.
URI: http://dx.doi.org/10.1016/j.microrel.2015.02.020
http://hdl.handle.net/11536/129777
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2015.02.020
期刊: MICROELECTRONICS RELIABILITY
Volume: 55
Issue: 11
起始頁: 2229
結束頁: 2235
Appears in Collections:Conferences Paper