| 標題: | Single-photon avalanche diodes in 0.18-mu m high-voltage CMOS technology |
| 作者: | Huang, L. D. Wu, J. Y. Wang, J. P. Tsai, C. M. Huang, Y. H. Wu, D. R. Lin, S. D. 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
| 公開日期: | 12-Jun-2017 |
| 摘要: | We have designed and fabricated high-performance single-photon avalanche diodes (SPADs) by using 0.18-mu m high-voltage CMOS technology. Without any technology customization. the SPADs have low dark-count rate, high photon-detection probability, low afterpulsing probability, and acceptable timing jitter and breakdown voltage. Our design provides a low-cost and high-performance SPAD for various applications. (C) 2017 Optical Society of America |
| URI: | http://dx.doi.org/10.1364/OE.25.013333 http://hdl.handle.net/11536/145674 |
| ISSN: | 1094-4087 |
| DOI: | 10.1364/OE.25.013333 |
| 期刊: | OPTICS EXPRESS |
| Volume: | 25 |
| Issue: | 12 |
| 起始頁: | 13333 |
| 結束頁: | 13339 |
| Appears in Collections: | Articles |
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- Crosstalk Between Single-Photon Avalanche Diodes in a 0.18-mu m High-Voltage CMOS Process / Wu, Dai-Rong;Tsai, Chia-Ming;Huang, Yi-Hsiang;Lin, Sheng-Di
- Constant Excess Bias Control for Single-Photon Avalanche Diode Using Real-Time Breakdown Monitoring / Chang, Po-Hsuan;Tsai, Chia-Ming;Wu, Jau-Yang;Lin, Sheng-Di;Kuo, Ming-Ching
- 標準CMOS高壓技術製作之單光子累崩二極體 / 黃來得;林聖迪;Huang, Lai-De;Lin, Sheng-Di
- SIMULATION OF ELECTRIC FIELD DISTRIBUTION IN CMOS SINGLE PHOTON AVALANCHE DIODES AT BREAKDOWN VOLTAGE / Wu, Jau-Yang;Lin, Sheng-Di
- Low-noise single-photon avalanche diodes in 0.25 mu m high-voltage CMOS technology / Hsu, Fang-Ze;Wu, Jau-Yang;Lin, Sheng-Di
- Time-Correlated Crosstalk Measurements between CMOS Single-Photon Avalanche Diodes / Wu, Dai-Rong;Tsai, Chia-Ming;Lin, Sheng-Di
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