標題: | MAUI: Making Aging Useful, Intentionally |
作者: | Wu, Kai-Chiang Tseng, Tien-Hung Li, Shou-Chun 資訊工程學系 Department of Computer Science |
公開日期: | 1-一月-2018 |
摘要: | Device aging, which causes significant loss on circuit performance and lifetime, has been a primary factor in reliability degradation of nanoscale designs. In this paper, we propose to take advantage of aging-induced clock skews (i.e., make them useful for aging tolerance) by manipulating these lime-varying skews to compensate for the performance degradation of logic networks. The goal is to assign achievable/reasonable aging-induced clock skews in a circuit, such that its overall performance degradation due to aging can be minimized, that is, the lifespan can be maximized. On average, 25% aging tolerance can be achieved with insignificant design overhead. |
URI: | http://hdl.handle.net/11536/146203 |
ISSN: | 1530-1591 |
期刊: | PROCEEDINGS OF THE 2018 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE) |
起始頁: | 527 |
結束頁: | 532 |
顯示於類別: | 會議論文 |