標題: Invalid state identification for sequential circuit test generation
作者: Liang, HC
Lee, CL
Chen, JE
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 1996
URI: http://hdl.handle.net/11536/19837
ISBN: 0-8186-7478-4
期刊: PROCEEDINGS OF THE FIFTH ASIAN TEST SYMPOSIUM (ATS '96)
起始頁: 10
結束頁: 15
Appears in Collections:Conferences Paper