A fast and sensitive built-in current sensor for IDDQ testing

Title:	A fast and sensitive built-in current sensor for IDDQ testing
Authors:	Lu, CW Lee, CL Chen, JE 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics
Issue Date:	1996
URI:	http://hdl.handle.net/11536/19867
ISBN:	0-8186-7655-8
Journal:	1996 IEEE INTERNATIONAL WORKSHOP ON IDDQ TESTING, DIGEST OF PAPERS
Begin Page:	56
End Page:	58
Appears in Collections:	Conferences Paper