圖形化藍寶石基板缺陷檢測之研究

標題:	圖形化藍寶石基板缺陷檢測之研究 Inspection of Patterned Sapphire Substrate Defects
作者:	張嘉原 Chang, Chia-Yuan 洪紹剛 Hung, Shao-Kang 工學院精密與自動化工程學程
關鍵字:	缺陷檢測;視覺;Defects Inspection;Vision
公開日期:	2011
摘要:	本研究主要目的為設計一光學檢查系統, 針對圖形化藍寶石基板上的瑕疵檢測出來, 並加以分類以利後續製程。在設計光學檢測系統中, 需先完成基本的影像處理功能, 如二值化, 直方圖, ROI 形態學處理, 以及邊緣檢測的基本功能。本研究利用 Boland C++ 5.0 做為程式撰寫工具,開發出影像處理的基本功能, 且透過實際的CCD 拍攝影像來判斷, 並修改核心參數以達到最適化, 主要的研究環境, 程式都可以轉移到將來的自動化生產,以改善LED 的製造成本。 An optical inspection system for PSS is designed in this thesis. Before this inspection system, some basic image processing functions shall be implemented first , like thresholding , histogram , morphology , and edge detection. Boland C++ 5.0 is the programming tool used for image processing. By taking the real PSS image for inspection, we can optimize the parameter. Also, we can transfer this research to factory automation to reduce the cost and mass production.
URI:	http://140.113.39.130/cdrfb3/record/nctu/#GT079969510 http://hdl.handle.net/11536/50816
Appears in Collections:	Thesis

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