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dc.contributor.author廖茂原en_US
dc.contributor.authorMou-Yuan Liaoen_US
dc.contributor.author彭文理en_US
dc.contributor.authorWen-Lea Pearnen_US
dc.date.accessioned2014-12-12T02:11:57Z-
dc.date.available2014-12-12T02:11:57Z-
dc.date.issued2006en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#GT009133806en_US
dc.identifier.urihttp://hdl.handle.net/11536/57867-
dc.description.abstract製程能力指標廣泛的應用在製造業上,由於這些指標精確地量化製程能力與製程表現,因此這些指標對於成功的改善製程品質與製程流程上,扮演重要的角色。然而,在大多數的製程能力分析上卻未考慮量測誤差,在衡量製程能力時,描述品質特徵的資料卻是與量測工具息息相關的,因此,若不考慮量測誤差下,只依照單一的製程能力指標值來衡量製程能力的結論將是不可靠的。在我們的研究中,我們討論量測誤差對於製程能力指標Cp、Cpk、Cpu和Cpl的估計值有哪些影響,並且提出修正的信賴區間與檢定臨界值,以應用於量測誤差在不可避免下的製程能力分析。我們的研究可以幫助實行者做精確的製程能力評估,並做較可靠的決策。zh_TW
dc.description.abstractProcess capability indices have been widely used in the manufacturing industry. Those capability indices, quantifying process potential and performance, are important for any successful quality improvement activities and quality program implementation. Most research works related to process capability analysis have assumed no gauge measurement errors. However, the quality of data on the process characteristics relies very much on the gauge measurement. Conclusions about capability of the process just only based on the single numerical value of the index are not reliable. In our research study, we conduct the performance of the estimators of the indices, Cp, Cpk, Cpu and Cpl with gauge measurement errors, and present adjusted confidence interval bounds and critical values for capability estimation or testing purpose of those indices with unavoidable measurement errors. Our research would help practitioners to determine whether the factory processes meet the capability requirement, and make more reliable decisions.en_US
dc.language.isoen_USen_US
dc.subject信賴區間zh_TW
dc.subject檢定臨界值zh_TW
dc.subject量測誤差zh_TW
dc.subject製程能力分析zh_TW
dc.subjectconfidence intervalen_US
dc.subjectcritical valueen_US
dc.subjectgauge measurement erroren_US
dc.subjectprocess capability analysisen_US
dc.title考慮量測誤差下的製程能力指標zh_TW
dc.titleProcess Capability Indices with Measurement Errorsen_US
dc.typeThesisen_US
dc.contributor.department工業工程與管理學系zh_TW
Appears in Collections:Thesis


Files in This Item:

  1. 380601.pdf
  2. 380602.pdf
  3. 380603.pdf
  4. 380604.pdf
  5. 380605.pdf
  6. 380606.pdf
  7. 380607.pdf
  8. 380608.pdf
  9. 380609.pdf
  10. 380610.pdf
  11. 380611.pdf
  12. 380612.pdf

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