RF CMOS之特性量測、模式建立與可靠性研究

標題:	RF CMOS之特性量測、模式建立與可靠性研究 RF CMOS Characterization, Modeling and Reliability Study
作者:	汪大暉 WANG TAHUI 交通大學電子工程系
關鍵字:	射頻;互補式金氧半導體;S-參數;雜訊;電路模式;天線效應;熱電子;RF;CMOS;S-parameter;Noise;Circuit model;Antenna effect;Hot carrier
公開日期:	2000
官方說明文件#:	NSC89-2215-E009-034
URI:	http://hdl.handle.net/11536/89519 https://www.grb.gov.tw/search/planDetail?id=542099&docId=99581
Appears in Collections:	Research Plans

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